How Are Conducted Susceptibility Tests Performed?
The susceptibility of a device to noise coupled to its interconnecting cables is typically tested by
placing the device on a test bench, placing an injection probe around the under test, and driving a controlled radio
frequency signal to the injection probe. For some standards, a second
probe is placed around the conductors under test to allow for real-time
monitoring of the injected signal. Tests are often performed inside
shielded enclosures to protect personnel from potentially hazardous field levels
and to prevent interference with RF communication systems and nearby electronic
equipment. The arrangement of the device and its cables is carefully
controlled to standardize the test and to make test results as repeatable as
possible. The test bench is typically constructed of non-conductive
material and may be covered with aluminum or copper as required by the
regulatory agency. Likewise, the injection probe distance from the device
and the conductor height above ground plane are controlled. For large
devices, such as equipment racks and vehicles, the equipment is generally
configured in a manner equivalent to its final installation.
The general arrangement of test equipment for method CS114 of MIL-STD-461E is shown in
the following figure for example.
With regard to the CS Analyst conducted
susceptibility model, the EUT represents either the left-hand circuit or right-hand circuit. In the case where CS
test signals are injected on the power leads the LISNs represent the other
(right-hand or left-hand) circuit and the power leads represent the Conductors.
More:
 Conducted Susceptibility Controls
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